Keysight World 2019
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產生 5G New Radio 信號的 4 個秘訣 加速完成 5G NR 設計驗證
VXG Microwave Signal Generator
測試 5G New Radio 裝置
5G Multi-Band Vector Transceiver
認識並利用信號產生器測試 多通道射頻系統 第一章:時序同步
5G 對自動駕駛系統有何影響 ADAS 和自動駕駛可提升安全性並挽救生命
瞭解 5G 共存測試要求
加速 5G 裝置開發的五大策略
認識並利用信號產生器測試 多通道射頻系統 第二章:相位同調和相位可調同調系統
5G New Radio裝置設計人員的主要考量
Using Simulation to Overcome 3 Millimeter Wave Design Challenges - White Paper
邁向 5G 的第一步:克服 New Radio 裝置設計挑戰系列專文 第 4 部分:空中介面測試
邁向 5G 的第一步:克服 New Radio 裝置設計挑戰系列專文 第 3 部:MIMO 和波束成形
5G New Radio 測試考量
邁向 5G 的第一步 克服新空中介面(New Radio)裝置的設計挑戰—系列專文
邁向 5G 的第一步克服新空中介面(New Radio)裝置的設計挑戰 —系列專文 第二章:毫米波頻譜
適用於毫米波 5G NR 裝置和系統的 OTA 測試
5G Protocol R&D Toolset
E6640A EXM Wireless Test Set - Data Sheet
Your Map to High Speed Data Centers - Infographic
Keysight Technologies OFC Booth Guide
Ten Things You Need To Know About Data Center Innovation
400GE is Revolutionary #Not Evolutionary - eBook
Evolution of High-Speed Computing Interfaces - White Paper
Accelerating from 100GE to 400GE in the Data Center Advanced Modulation and Coding Challenges - White Paper
400GE Transceiver Characterization and Compliance Test: Addressing Top Three Concerns of Data Center Operators
400GE Data Center Transceiver Test: Overcoming Three Key Challenges - White Paper
Reduce Test Time, Reduce Cost: Data Center Component and Transceiver Test - White Paper
Everything You Need to Know About Coherent Optical Modulation - White Paper
CCIX – A New Interconnect Technology - White Paper
The Fast Track to PCIe 5.0 - White Paper
Thunderbolt 3 - How to Test and Troubleshoot - White Paper
DDR Memory Test Challenges from DDR3 to DDR4 and DDR5 - White Paper
DDR5 - Full Speed Ahead to 400GE - White Paper
Evolved Testing Methods to Achieve DDR4 Compliance - Application Note
How to Address USB Type-C™ Transmitter and Receiver Test Challenges - Application Note
How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors - Application Note
Laser Diode Characterization and Its Challenges - White Paper
PAM-4 Design Challenges and the Implications on Test – Application Note
Test, Debug and Verification of PCI Express™ Designs - Application Note
Coherent Optical Transforms Data Center Interconnects - White Paper
Coherent Optical Communications Test Challenges - Application Note
LIV Test of VCSEL for 3D Sensing - Application Note
Making Your Best Power Integrity Measurements - Application Note
High Speed Lightwave Component Analysis - Application Note
Pulse, Pattern, Function, and Arbitrary Waveform Generators - App Note
Digital Design & Interconnect Standards - Brochure
Data Center & Infrastructure GLOSSARY OF TERMS
USB Design and Test - A Better Way - Brochure
Complete solutions for characterization, debug, compliance test of HDMI designs
HDMI 2.1 Compliance Test Solution - Generic flyer
MIPI® DigRFSM v4 (M-PHY®) Protocol Triggering and Decode - Technical Overview
MIPI® RF Front-End Control Interface (RFFESM) Protocol Triggering and Decode - Data Sheet
MIPI D-PHY Protocol Triggering and Decode for Infiniium Series Oscilloscope -Technical Overview
Physical Layer Test System (PLTS) 2018
Overcoming Crosstalk Challenges in Today’s Digital and Wireless Designs - Application Note
Infiniium UXR-Series Oscilloscopes - Data Sheet
Infiniium V-Series Oscilloscopes - Data Sheet
Infiniium S-Series High-Definition Oscilloscopes - Data Sheet
N4391B Optical Modulation Analyzer - Data Sheet
N4917B Optical Receiver Stress Test Solution - Brochure
Keysight N4373E 43.5/50/67 GHz 單模光纖 100G/400G/1T 電光測試光波元件分析儀
N1000A DCA-X Wide Bandwidth Oscilloscope Mainframe and Modules - Data Sheet
N1090A, N1092A/B/C/D/E and N1094A/B DCA-M Optical and Electrical Sampling Oscilloscopes - Data Sheet
M8040A High-Performance BERT 64 Gbaud - Data Sheet
J-BERT M8020A High-Performance BERT - Data Sheet Version 5.0
Electrical and Optical Clock Data Recovery Solutions - N1078A & N1076B (64 GBd) and N1076A & N1077A (32 GBd)
M8190A Arbitrary Waveform Generator - Data Sheet
M8194A 120 GSa/s Arbitrary Waveform Generator - Data Sheet
Lightwave Catalog: Test & Measurement Networks and Data Centers - Catalog
U4164A Logic Analyzer Module - Data Sheet
Oscilloscope Probes and Accessories - Selection Guide
N7018A Type-C 測試控制器
N7015A, N7016A and N7017A Type-C Test Fixtures - Data Sheet
Automotive Innovation 2020 (2020年汽車創新)
Testing is Critical for Adoption of Autonomous Vehicles - White Paper
Test the Future, Today. - Solution Brochure
How 5G Will Influence Autonomous Driving Systems
How Millimeter Wave Automotive Radar Enhances Advanced Driver Assistance Systems (ADAS) and Autonomous Driving
Design & Test Solutions for Auto & Energy (V2X、Autonomous Car、E-Mobility)
Signal Studio for V2X - Technical Overview
E6953A DSRC COC Test Solution - Solution Brief
DSRC 802.11p is Ready for Advanced Driver Assistance Systems (ADAS) - White Paper
E6950A eCall Conformance Test Solution - Brochure
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note
Successful Deployment of eCall Live Crash Test - Case Study
Automotive Radar Testing Solutions - Solution Brief
E8740A Automotive Radar Signal Analysis and Generation Solution
E8708A Radar Target Simulator
Validating Automotive Ethernet Conformance and Performance - Case Study
Automotive Ethernet Solutions (車載乙太網路解決方案)
Why Autonomous Driving Systems Will Require Automotive Ethernet - White Paper
Design and Test Solutions for E-Mobility Applications
Energy Ecosystem – Technologies driving the future of e-Mobility - White Paper
DC-DC Converter Testing - Case Study
Battery Maker Cuts Testing Time, Ensures Quality with Innovative Li-Ion Cell Self-Discharge Test
How to Shorten Li-Ion Self-Discharge Test Time
Evaluate Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required
Battery Temperature Profiling While Charging and Discharging (電池充放電過程中的溫度特性分析)
Power Conversion Efficiency Measurement Methods (能源轉換效率量測方法)
Challenges and Solutions for Power Testing in Automotive Applications
Emerging Solutions to Hybrid & Electric Vehicle DC: DC Converter Design and Test - White Paper
EV1003A Hybrid-Electric/Electric Vehicle Power-Converter Test Solution
Scienlab Energy Storage Discover - Brochure
Scienlab Energy Storage Test Systems - Brochure
Charging Discovery System - Brochure
Scienlab Lab Discover - Brochure
Scienlab Machine Emulator - Brochure
Vector Network Analyzer - Selection Guide
PNA-X Series Microwave Network Analyzers - Brochure
E5080B ENA Series Vector Network Analyzer - Data Sheet
E5071C ENA Option TDR Enhanced Time Domain Analysis - Technical Overview
S93011A Enhanced Time Domain Analysis with TDR - Technical Overview (PNA-TDR)
S93011A Enhanced Time Domain Analysis with TDR - Flyer (PNA-TDR)
E5063A ENA Vector Network Analyzer – Brochure
E5063A ENA Series PCB Analyzer - Technical Overview
Signal Generator Selection Guide
Signal Analyzer and Spectrum Analyzer - Selection Guide
Power Meters and Power Sensors - Selection Guide
X8711A IoT Device Functional Test Solution - Flyer
X8712A IoT Device Battery Life Optimization Solution - Flyer
Accelerate debug and evaluation of IoT devices by current profile analysis - Application Note
經銷商全產品型錄
電源產品解決方案
InfiniiVision 4000 X系列示波器
InfiniiVision 3000T X 系列示波器
InfiniiVision 2000 X-Series Oscilloscopes
InfiniiVision 1000 X 系列示波器
E36300 系列程控型直流電源供應器
充分發揮示波器效能的6個基本秘訣
CX3300 系列元件電流波形分析儀
Fieldfox Handheld Analyzers
PathWave Analytics - Technical Overview
Keysight Trade-In 汰舊換新、就趁現在、永保競爭優勢
Keysight Premium Used 近乎新品、成本更低 100% Keysight 品質保證
Keysight Technologies 獲得您需要的校驗服務
Keysight Technologies 談校正的六個構面
KeysightCare 支援、提升。
是德科技服務 在您的產品生命週期中降低測試風險
EEsof EDA Premier Communications Design Software - Brochure
Using Simulation to Overcome 3 Millimeter Wave Design Challenges - White Paper
透過無線能量採集電路 延長物聯網裝置的使用壽命
重新定義無線收發器 以實現突破性的 5G 連接
如果自行開發的測試軟體導致產品開發步調變慢,該怎麼辦?
Analysis of Test Time in Electronics Development Workflows - White Paper
Got Python? Unlock the Future of Test Automation Quickly - White Paper
5G 製造商將測試時間縮短了 20 倍
AresONE-400GE OSFP High-Density 8-Port Test System
5G Core Testing
5G RAN Testing
2019 Security Report