是德科技 AI/6G 元件測試論壇

#	講義
1	【恕不提供下載】(NYCU) Compound Semiconductor for AI & AI for Compound Semiconductor
2	(Keysight) Empowering Next-Gen AI Architectures Through Validation of High-Speed Network and Co-Packaged Optics Integration
3	(Keysight) Advancing Characterization Techniques for High-Speed and High-Frequency Components, Materials, and Interconnects
4	(Keysight) Innovative Test Methods and EVM Measurement Techniques for Wireless Power Amplifiers
5	(Keysight) Characterizing ReRAM and WBG Power Devices: Advancing AI Hardware Development
6	(Samtec) 224Gbps CPC (Co-Package Copper/Connector) Challenge and Solution
7	(FormFactor) Novel True-Kelvin MEMS Analytical DC Probes to Enable Accurate and Repeatable Characterization of Advanced-Node Devices for AI Applications
8	(MPI) Advanced On-Wafer Techniques for Accurate Characterization of High-Speed Communication Signals Using Lightwave Component Analyzers

#	型錄/網頁
1	Wireless 無線通訊測試資源網
2	6G 資源網
3	6G 創新資源網
4	AI 資源網
5	AI/ML for EDA
6	使用 Keysight PathWave/EDA 加快您的工作流程
7	高速數位系統設計 High-Speed Digital System Design
8	光學量測方案 Photonic Test & Measurement
9	材料測試 Materials Test
10	汽車與能源 Automotive & Energy
11	網路分析儀
12	頻譜（信號）分析儀
13	信號產生器（源）
14	功率元件分析儀 / 曲線追蹤儀
15	WBG（寬能隙）動態功率元件分析儀 / 雙脈衝測試儀
16	任意波形產生器 Arbitrary Waveform Generators
17	I/V 及電源量測設備 SMU（Source Measure Units）
18	示波器 Oscilloscopes
19	Infiniium DCA 取樣示波器 Infiniium DCA Equivalent-time Sampling Oscilloscopes
20	誤碼率測試儀 Bit Error Ratio Testers
21	4080 系列半導體參數測試系統 Parametric Test Systems
22	Samtec 美商深特有限公司台灣分公司
23	FormFactor 美商福達電子股份有限公司台灣分公司
24	MPI Corporation 旺矽科技股份有限公司
25	NYCU 國立陽明交通大學 WLab