是德科技半導體元件建模解決方案研討會

#	Topic
1	News Updates for Device Modeling Solutions
2	Accurate Modeling of the Self-Heating and Trapping Effects in GaN HEMTs
3	Reliability Analysis of Silicon Devices
4	Elevate Your Semiconductor Device Modeling Efficiency with Recentering
5	Artificial Neural Network(ANN) for Enhancing BSIM4 RF Model Accuracy
6	New De-Facto Standard Software for On-Wafer Random Telegraph Noise Measurement

#	技術資訊
1	元件建模與特性分析產品
2	E4727B 進階低頻雜訊分析儀
3	Enabling Noise Measurements on Magnetic Sensors
4	PathWave Model QA (MQA)
5	PathWave Model Builder (MBP)
6	PathWave Device Modeling
7	Trapping Extraction of GaN HEMTs
8	Keysight W7801B New De-Facto Standard Software for B1530A (WGFMU)
9	Qualify CMOS Models with QA Express in Model Builder (MBP)
10	E4727B/W7802B Advanced Low-Frequency Noise Analyzer/Measurement Bundle Software
11	PathWave WaferPro Software