【新竹/高雄】是德科技 B5G 元件測試論壇

#	簡報資料
1	(P1) New VNA and Phase Noise Measurement Solutions for 5G/6G/A&D Applications - Keysight Kenny Liao
2	(P2) OTA GoT Measurements of Active Phased Array Antennas and Multi-Port Test Solutions - Keysight Kenny Liao
3	(P3) 112Gb/s High Speed & 110GHz RF Interconnection and Signal Integrity Test - Samtec Leon Wu
4	(P4) WBG Power Device Applications, Modeling and Measurement Solutions - Keysight, Jay Liao/Joe Lin
5	(P5) Making Traceable and Accurate sub-THz Measurements for Wafer Test Applications - FormFactor Choon-Beng Sia
6	(P6) Accelerating the Development of High-Speed, mmWave-Frequency, and High-Power Semiconductor Products and Applications - MPI Andrej Rumiantsev

#	資源網頁
1	Keysight 產品及方案綜合型錄（Keysight Product and Solution Catalogs）
2	5G Solutions
3	6G Innovation
4	高速數位系統設計 High-Speed Digital System Design
5	光學量測方案 Photonic Test & Measurement
6	材料測試 Materials Test
7	汽車與能源 Automotive & Energy
8	網路分析儀
9	頻譜（信號）分析儀
10	信號產生器（源）
11	功率元件分析儀 / 曲線追蹤儀
12	WBG（寬能隙）動態功率元件分析儀 / 雙脈衝測試儀
13	任意波形產生器 Arbitrary Waveform Generators
14	I/V 及電源量測設備 SMU（Source Measure Units）
15	示波器 Oscilloscopes
16	Infiniium DCA 取樣示波器 Infiniium DCA Equivalent-time Sampling Oscilloscopes
17	誤碼率測試儀 Bit Error Ratio Testers
18	4080 系列半導體參數測試系統 Parametric Test Systems