| Opening |
08:30 ~ 09:05 |
35
|
Check
In 報到及展攤交流 |
All |
| 09:05 ~ 09:10 |
5
|
Opening
致歡迎詞暨議程簡介 |
|
【Session 1】
High Power
高功率寬能隙半導體
09:10 - 10:20
(70 mins)
|
09:10 ~ 09:40 |
30
|
(1) WBG Power Device Applications, Modeling and Measurement Solutions |
Keven
Chang, Solutions Engineer, Solutions Engineering Organization of Keysight |
| 09:40 ~ 10:00 |
20
|
(2) 4080/B1505A High Voltage Parametric Test Solution |
Ginny
Ko, Account Manager, Semiconductor Solution Test of Keysight |
| 10:00 ~ 10:20 |
20
|
(3) Gate Reliability and Dynamic On-resistance in p-GaN Gate AlGaN/GaN HEMT |
Yue-Ming
Hsin, Director, Optical Science Center & Professor, Department of
Electrical Engineering, National Central University |
| |
10:20 ~ 10:40 |
20
|
Break
& Booth 茶點休息及展攤活動 |
All |
【Session 2】
Computing
巨量傳輸及計算
10:40 - 12:30
(110 mins)
|
10:40 ~ 11:10 |
30
|
(4) Material Measurements for 5G and mmWave Applications |
Kenny
Liao, Solutions Engineer, Solutions Engineering Organization of Keysight |
| 11:10 ~ 11:40 |
30
|
(5) Opto-Electrical Measurements for Integrated Silicon Photonics and SERDES
Applications |
Joe
Lin, Solutions Engineer, Solutions Engineering Organization of Keysight |
| 11:40 ~ 12:10 |
30 |
(6) Silicon Photonics Challenges and Solutions for Wafer Level Tests |
Mr.
Dan Rishavy, OSM Market Segment Director of FormFactor |
| (7) Automatic to Autonomous – Taking the next
step to true hands-free RF Calibrations and Measurements |
Mr.
Giancarlo De Chirico, RF Market Segment Director of FormFactor |
| 12:10 ~ 12:30 |
20
|
(8) How to Achieve Trustable RF Calibration and Confident Data When
Characterizing Super-fast Interconnects |
Alvin
Shao, RF Specialist Senior Application Engineer of MPI Corporation |
| |
12:30 ~ 13:20 |
50
|
Lunch
& Booth 午餐休息及展攤活動 |
All |
【Session 3】
Communication
高速通訊
13:20 - 15:00
(100 mins)
|
13:20 ~ 13:50 |
30
|
(9) Innovations of Network Analyzer for Testing Next-Generation RF/mmWave
Components |
Kenny
Liao, Solutions Engineer, Solutions Engineering Organization of Keysight |
| 13:50 ~ 14:20 |
30
|
(10) Overcome mmWave Antenna and Multiport Component Test Challenges |
Joe
Lin, Solutions Engineer, Solutions Engineering Organization of Keysight |
| 14:20 ~ 14:40 |
20
|
(11) 5G FR2 Market and Beamformer IC Update |
Alan
Chang, Asia Pacific Sales Director of Anokiwave |
| 14:40 ~ 15:00 |
20
|
(12) AiP Application and Verification Case Study |
Su-Wei
Chang, Founder and CEO of TMY Technology Inc. |
| |
15:00 ~ 15:20 |
20
|
Break
& Booth 茶點休息及展攤活動 |
All |
【Session 4】
High Volume Production
高產能
15:20 - 16:30
(70 mins)
|
15:20 ~ 16:00 |
40
|
(13) Ultra Fast and Massive Parametric Testing |
Yu-Chen
Hsu, Sr. Solutions Engineer, Semiconductor Solution Test of Keysight |
| 16:00 ~ 16:30 |
30
|
(14) 3D Sensing Devices Testing: Overcoming Top 5 LIV Test Challenges |
Joe
Lin, Solutions Engineer, Solutions Engineering Organization of Keysight |
| |
16:30 ~ 16:40 |
10
|
Wrap-up
& Lucky Draw 幸運摸彩 |
All |
